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Creating A Smarter World

ZERONE offers tailored solutions covering everything from product definition to software and hardware development, supported by our experienced senior product engineers.

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Semiconductor Industry Inspection

Transient Absorptione Series Fluorescence Spectroscopy Series Non-linear Optics Series High-Speed Camera Series Laser Series Semiconductor Industry Inspection High-Speed Detectors

SiC Substrate Dislocation Defect Non-Destructive Testing System

Specialized equipment for detecting dislocation defects in SiC substrates

SiC Wafer Minority Carrier Lifetime Quality Imaging Monitoring System

High-speed imaging of substrate quality (carrier lifetime) for wafers

Perovskite Solar Cell Comprehensive Performance Analysis System

Compatible with various cell sizes, including 10 cm x 10 cm and 30 cm x 30 cm.

Micro LED Wafer-Level Comprehensive Testing and Analysis System

Wafer size detection: 4".

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