Micro LED Wafer-Level Comprehensive Testing and Analysis System
Wafer size detection: 4".
uLED types measured: RGB. Detection types for bright field/PL: Bright field defect analysis, electrode defect analysis, PL defect analysis. EL electrical testing items: V-I curve, R1/IR2/IR3, VF1/VF2/F3.
EL colorimetric testing items: Cx, Cy, WLD, EQE.
PL/AOI detection speed: 10 minutes per piece (4").
EL detection speed: 1.5 seconds from die to die.
